Image and Analysis Unit

Our expertise and capabilities

Scanning electron microscopy (SEM)

The SEM can image sample materials at up to one million times magnification with a potential resolution of two nanometres.

Using SEM and EDS we can deliver high quality nanoscale level resolution imaging and elemental analysis of your samples.

We have two SEM available:

Zeiss Sigma Field Emission Gun SEM (FEG-SEM) equipped secondary electron, backscattered electron, scanning transmission electron, and X-ray detectors.

The FEG-SEM is used for Nano-resolution imaging of dry samples.

Zeiss EVO LS-15 Environmental SEM (ESEM) equipped with secondary electron, backscattered electron, and X-ray detectors.

The ESEM allows moisture-containing samples to be examined in their native state using a variable pressure environmental chamber.

KEY FEATURES

•  Field emission gun scanning electron microscopy (FEG-SEM)

• Environmental scanning electron microscopy (ESEM)

• Secondary electron imaging (SE)

• Backscattered electron imaging (BSE)

• Scanning transmission electron imaging (STEM)

• Oxford Instruments X-max Energy dispersive X-ray spectroscopy (EDS)

Output signals 

1 - Secondary electrons:

These are low energy electrons generated by the interaction of the incident beam with the sample material and provide surface morphology images, to visualise the sample shape and size.

2 - Backscattered electrons:

These are high energy electrons within the incident beam that are reflected back by the sample material.

The intensity of backscatter is relative to the atomic weight of the sample and provides elemental phase images, to visualise the presence of differing chemical elements within a sample.

3 - X-rays:

These are liberated from the sample material during the process of secondary electron generation. They can be used to identify and quantify the chemical elements within a sample via EDS and produce spot analysis spectra and element maps. 

Additional equipment available