Scanning electron microscopy (SEM)
The SEM can image sample materials at up to one million times magnification with a potential resolution of two nanometres.
Using SEM and EDS we can deliver high quality nanoscale level resolution imaging and elemental analysis of your samples.
We have two SEM available:
Zeiss Sigma Field Emission Gun SEM (FEG-SEM) equipped secondary electron, backscattered electron, scanning transmission electron, and X-ray detectors.
The FEG-SEM is used for Nano-resolution imaging of dry samples.
Zeiss EVO LS-15 Environmental SEM (ESEM) equipped with secondary electron, backscattered electron, and X-ray detectors.
The ESEM allows moisture-containing samples to be examined in their native state using a variable pressure environmental chamber.